专利名称：Device and method for impedance analysis发明人：Cihun-Siyong Gong,Yi-Feng Luo,Li-Ren
Huang,Kai-Cheung Juang
申请号：US14092759申请日：20131127公开号：US09261566B2公开日：20160216
专利附图：
摘要：An impedance analysis device adapted to an object under test (OUT) includes asignal generator, a signal analysis unit and a processing unit. The signal generatoroutputs a pulse signal to the OUT. The signal analysis unit acquires a response signal
which the OUT responds to the pulse signal, and analyzes the response signal to obtainan analysis parameter. The processing unit coupled to the signal analysis unit receives theanalysis parameter, so as to obtain an impedance variation characteristic of the OUT.
申请人：INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
地址：Hsinchu TW
国籍：TW
代理机构：Muncy, Geissler, Olds & Lowe, P.C.
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